Oak Ridge National Laboratory
The same image shown using different analysis methods. a) Raw electron microscopy image. b) Defects (white) as labelled by a human expert. c) Defects (white) as labelled by a Fourier transform method. d) Defects (white) as labelled by the optimal neural network. Defects that don’t exist are shown in purple, and defects that weren’t identified are orange. In mere hours, researchers created a neural network that performed as well as a human expert, demonstrating MENNDL’s ability to significantly reduce the time to analyze electron microscopy images.