Tailored AFM Probes Created Via 3-D Direct Laser Writing
American Institute of Physics (AIP)Atomic force microscopy (AFM) is a technique that allows researchers to analyze surfaces at the atomic scale, and it’s based on a surprisingly simple concept: A sharp tip on a cantilever “senses” the topography of samples. Now, a group of Karlsruhe Institute of Technology researchers report, in this week’s Applied Physics Letters, that they have developed a method to tailor tips for specific applications via 3-D direct laser writing based on two-photon polymerization.